The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Sep. 24, 2009
Bruce Walsh, Londonderry, NH (US);
Boris Blanter, Lexington, MA (US);
Matthew Barra, Hingham, MA (US);
Brian Connolly, Winthrop, MA (US);
Greg Yantz, Somerville, MA (US);
Paul Gervasio, North Billerica, MA (US);
Don Straus, Charlestown, MA (US);
Bruce Walsh, Londonderry, NH (US);
Boris Blanter, Lexington, MA (US);
Matthew Barra, Hingham, MA (US);
Brian Connolly, Winthrop, MA (US);
Greg Yantz, Somerville, MA (US);
Paul Gervasio, North Billerica, MA (US);
Don Straus, Charlestown, MA (US);
FIRST LIGHT DIAGNOSTICS, INC., Chelmsford, MA (US);
Abstract
The invention provides analyzers that improve tests for detecting specific cellular, viral, and molecular targets in clinical, industrial, or environmental samples. The invention permits efficient and specific selection and sensitive imaging detection of individual microscopic targets at low magnification. Automated embodiments allow efficient walk-away, on-demand, random-access high-throughput testing. The analyzers perform tests without requiring wash steps thus streamlining engineering and lowering costs. Thus, the invention provides analyzers that can deliver rapid, accurate, and quantitative, easy-to-use, and cost-effective tests for analytes.