Forward Citations = 274

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8 inventors (with patents filed for the assignee):

Kefeng Liu (2 out of 4 patents)

Zhong Chen (2 out of 2 patents)

Timothy E Harrington (2 out of 2 patents)

4. Michael David Foegelle (1 out of 28 patents)

5. Bryan Howard Sayler (1 out of 4 patents)

6. Stephen R Kaufman (1 out of 2 patents)

7. F Gary Rodriguez (1 out of 1 patent)

8. James S McLean (1 out of 1 patent)

5 patents: Sort by Forward Citations

1. 6657214 - Shielded enclosure for testing wireless communication devices (2003-12-02),

2. 6501017 - Electromagnetic radiation seal for a member penetrating a shielded enclosure (2002-12-31),

3. 6489931 - Diagonal dual-polarized broadband horn antenna (2002-12-03),

4. 6057805 - Broad band shaped element antenna (2000-05-02),

5. 5945962 - Broad band shaped element dipole antenna (1999-08-31),

Company Overview

Emc Test Systems, L.P. is a leading provider of electromagnetic compatibility (EMC) testing solutions for a wide range of industries. With over 20 years of experience, our team of experts deliver high-quality EMC testing equipment and services to ensure compliance with international regulations. Our state-of-the-art facilities and innovative technology make us the preferred choice for companies seeking reliable EMC solutions.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

5 Patents

#494 in Austin, TX

#3,333 in Texas

#51,644 in US

Austin, TX, United States of America

Emc Test Systems, L.p.

Forward Citations = 274

8 inventors:

Kefeng Liu (2 out of 4 patents)

Zhong Chen (2 out of 2 patents)

Timothy E Harrington (2 out of 2 patents)

4. Michael David Foegelle (1 out of 28 patents)

5. Bryan Howard Sayler (1 out of 4 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Emc Test Systems, L.p.. Retrieved from https://idiyas.com/company/emc-test-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]