For the Inventor, By the Inventor

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Reno, NV, United States of America

Echelon Diagnostics, Inc.

USPTO Granted Patents = 3

Forward Citations = 2

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3 inventors (with patents filed for the assignee):

John P Burke (3 out of 10 patents)

Stephen Healy Sanders (2 out of 4 patents)

Brian K Rhees (1 out of 16 patents)

3 patents: Sort by Forward Citations

1. 12073921 - System for increasing the accuracy of non invasive prenatal diagnostics and liquid biopsy by observed loci bias correction at single base resolution (2024-08-27),

2. 11127485 - Techniques for fine grained correction of count bias in massively parallel DNA sequencing (2021-09-21),

3. 10331849 - System and method for construction of internal controls for improved accuracy and sensitivity of DNA testing (2019-06-25),

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USPTO Data Jan 1 1976 - Jan 6 2026

3 Patents

#140 in Reno, NV

#676 in Nevada

#72,066 in US

Reno, NV, United States of America

Echelon Diagnostics, Inc.

Forward Citations = 2

3 inventors:

John P Burke (3 out of 10 patents)

Stephen Healy Sanders (2 out of 4 patents)

Brian K Rhees (1 out of 16 patents)

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