Forward Citations = 39

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2 inventors (with patents filed for the assignee):

Maxim Ershov (7 out of 11 patents)

Andrei Tcherniaev (2 out of 2 patents)

7 patents: Sort by Forward Citations

1. 11599698 - IR drop analysis based on sensitivity analysis and visualization (2023-03-07),

2. 11544434 - Matched net and device analysis based on parasitics (2023-01-03),

3. 11544433 - Virtual repeater insertion (2023-01-03),

4. 11176295 - Matched net and device analysis based on parasitics (2021-11-16),

5. 11144688 - Virtual repeater insertion (2021-10-12),

6. 10783296 - Matched net and device analysis based on parasitics (2020-09-22),

7. 10762259 - Circuit design/layout assistance based on sensitivities to parasitics (2020-09-01),

Company Overview

Diakopto, Inc. is a leading software company specializing in innovative solutions for data analysis and business intelligence. Our platform empowers businesses to make data-driven decisions and gain valuable insights from their data. With a focus on user-friendly interfaces and cutting-edge technology, we help our clients unlock the full potential of their data. Leveraging advanced algorithms and machine learning techniques, we provide intuitive tools for data visualization, predictive analytics, and reporting. Diakopto, Inc. is dedicated to helping organizations streamline their processes and achieve measurable results through data optimization.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

7 Patents

#647 in San Jose, CA

#9,501 in California

#39,907 in US

San Jose, CA, United States of America

Diakopto, Inc.

Forward Citations = 39

2 inventors:

Maxim Ershov (7 out of 11 patents)

Andrei Tcherniaev (2 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Diakopto, Inc.. Retrieved from https://idiyas.com/company/diakopto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]