Zurich, Switzerland

Dek International Gmbh

Calculating rank
USPTO Granted Patents = 14

% Expired Patents = 7.1

Forward Citations = 97

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23 inventors (with patents filed for the assignee):

goldMedal Charles Moncavage (2 out of 10 patents)

silverMedal Frank Norman Squibb (2 out of 2 patents)

bronzeMedal David Godfrey Williams (2 out of 7 patents)

4.  Jeffrey R Willshere (2 out of 2 patents)

5.  Richard Murray (2 out of 2 patents)

6.  Fraser Murray Shaw (1 out of 3 patents)

7.  Ricky Bennett (1 out of 6 patents)

8.  James Graham Hall (1 out of 1 patent)

9.  Andrew Edmonds (1 out of 1 patent)

10.  Paul Lionel Cane (1 out of 1 patent)

11.  Peter John Jefferies (1 out of 1 patent)

12.  Terry Andrew Smith (1 out of 1 patent)

13.  Anthony Michael Weldon (1 out of 1 patent)

14.  Richard Andre Piatek (1 out of 3 patents)

15.  Ian Patrick McEvoy (1 out of 1 patent)


14 patents:

Company Overview
Dek International GmbH, based in Zurich, specializes in advanced technologies and solutions for various industries. The company focuses on the development and manufacturing of high-quality products, leveraging innovative engineering and design principles. With a commitment to research and development, Dek International is involved in sectors such as automation, electronics, and industrial applications, aiming to enhance efficiency and performance across its offerings. The organization is recognized for its expertise and dedication to delivering cutting-edge solutions tailored to client needs.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 27 2026

14 Patents

#56 in Zurich

#841 in Switzerland

#42,312 in the World

Zurich, CH
Zurich, Switzerland
Forward Citations = 97

23 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Dek International Gmbh. Retrieved from https://idiyas.com/company/dek-international

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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