For the Inventor, By the Inventor

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New York, NY, United States of America

Citicorp Usa, Inc.

USPTO Granted Patents = 2

Forward Citations = 0

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6 inventors (with patents filed for the assignee):

Anthony J Bauer (1 out of 8 patents)

Brian A Toussaint (1 out of 10 patents)

Ronald R Evers (1 out of 7 patents)

4. Charles Moehling (1 out of 15 patents)

5. Jong-Cheol Kim (1 out of 1 patent)

6. Thomas R Callahan (1 out of 11 patents)

2 patents: Sort by Forward Citations

1. 6403978 - Test pattern for measuring variations of critical dimensions of wiring patterns formed in the fabrication of semiconductor devices (2002-06-11),

2. 6330862 - Dead lever lug (2001-12-18),

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USPTO Data Jan 1 1976 - Dec 9 2025

2 Patents

#2,090 in New York, NY

#5,647 in New York

#92,599 in US

New York, NY, United States of America

Citicorp Usa, Inc.

Forward Citations = 0

6 inventors:

Anthony J Bauer (1 out of 8 patents)

Brian A Toussaint (1 out of 10 patents)

Ronald R Evers (1 out of 7 patents)

4. Charles Moehling (1 out of 15 patents)

5. Jong-Cheol Kim (1 out of 1 patent)

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