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For the Inventor, By the Inventor

Apple Valley, MN, United States of America

Celadon Systems, Inc.


USPTO Granted Patents = 45

% Expired Patents = 11.1

Forward Citations = 212

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9 inventors (with patents filed for the assignee):

goldMedal Bryan J Root (43 out of 43 patents)

silverMedal William A Funk (38 out of 42 patents)

bronzeMedal John L Dunklee (12 out of 48 patents)

4.  Dennis Flanders (2 out of 2 patents)

5.  Adam J Schultz (1 out of 1 patent)

6.  Michael Palumbo (1 out of 1 patent)

7.  Matthew Page (1 out of 1 patent)

8.  Garrett Tranquillo (1 out of 1 patent)

9.  Riley Kaiser (1 out of 1 patent)


Core Competencies:
Probe Card Assembly
Modular Rail Systems
High Voltage Probes
Probe Test Equipment
Test Apparatus
Latch Mechanism
Twist Lock Mechanism
Replaceable Probe
Shielded Probe
Electrical Test Probes
Top Contact Layout Board
Probe Tile

45 patents:

1. 11933816 - Portable probe card assembly (2024-03-19),
2. 11313902 - Modular rail systems, rail systems, mechanisms, and equipment for devices under test (2022-04-26),
3. 11275106 - High voltage probe card system (2022-03-15),
4. 10976347 - Magnet extension (2021-04-13),
5. 10620262 - Modular rail systems, rail systems, mechanisms, and equipment for devices under test (2020-04-14),
6. 10295565 - Probe card with stress relieving feature (2019-05-21),
7. 10261124 - Modular rail systems, rail systems, mechanisms, and equipment for devices under test (2019-04-16),
8. 10254309 - Test apparatus having a probe core with a latch mechanism (2019-04-09),
9. 10145863 - Test systems with a probe apparatus and index mechanism (2018-12-04),
10. 9910067 - Apparatus and method for terminating probe apparatus of semiconductor wafer (2018-03-06),
11. 9726694 - Test systems with a probe apparatus and index mechanism (2017-08-08),
12. 9678149 - Test apparatus having a probe core with a twist lock mechanism (2017-06-13),
13. 9279829 - Apparatus and method for terminating probe apparatus of semiconductor wafer (2016-03-08),
14. 9024651 - Test apparatus having a probe card and connector mechanism (2015-05-05),
15. 9018966 - Test apparatus having a probe card and connector mechanism (2015-04-28),
Celadon Systems, Inc., based in Apple Valley, MN, specializes in advanced semiconductor testing solutions. The company focuses on the development and manufacturing of probe card assemblies and high voltage probe cards, which are essential for efficient semiconductor wafer probing. Their expertise extends to modular rail systems and innovative test apparatuses, enhancing the reliability and performance of electrical test probes. Celadon Systems is committed to delivering cutting-edge technologies that support the evolving needs of the semiconductor industry.
Profile summary based on public USPTO records.

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USPTO Data Jan 1 1976 - Oct 6 2026

Celadon Systems, Inc.
45 Patents

#1 in Apple Valley, MN

#221 in Minnesota

#7,773 in US

#15,419 in the World

Apple Valley, MN (US)
Apple Valley, MN, United States of America

Celadon Systems, Inc.

Forward Citations = 212

9 inventors:

goldMedal Bryan J Root (43 out of 43 patents)

silverMedal William A Funk (38 out of 42 patents)

bronzeMedal John L Dunklee (12 out of 48 patents)

4.  Dennis Flanders (2 out of 2 patents)

5.  Adam J Schultz (1 out of 1 patent)

Please report any incorrect information to [email protected]
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