The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2015
Filed:
Jul. 06, 2012
Bryan J. Root, Apple Valley, MN (US);
William A. Funk, Eagan, MN (US);
Michael Palumbo, Hillsboro, OR (US);
John L. Dunklee, Tigard, OR (US);
Bryan J. Root, Apple Valley, MN (US);
William A. Funk, Eagan, MN (US);
Michael Palumbo, Hillsboro, OR (US);
John L. Dunklee, Tigard, OR (US);
Celadon Systems, Inc., Apple Valley, MN (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
A test apparatus for testing a semiconductor device includes a circuit board having a contact pattern on one side and an opening therethrough, and a probe card supporting a probe needle array. The probe needle array is insertable into the opening of the circuit board and is configured to probe a device under test. The probe needle array is in electrical contact with the contact pattern of the circuit board, to allow signals through the probe card and circuit board to a test equipment. A holder supports the probe card and other probe cards. The holder has multiple sides, each of which is supportable of a probe card having a probe needle array. The holder is rotatable to manipulate and position the probe needle arrays of the probe cards relative to a device under test. The holder allows disconnection and replacement of the probe needle arrays from the holder.