Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
20 Patents
#2 in Jackson, MI
#589 in Michigan
#16,416 in US
#31,315 in the World
Camp International, Inc.
Forward Citations = 826
14 inventors:
Jackson, MI, United States of America
Camp International, Inc.
Calculating rank
Trademarks = 2
Forward Citations = 826
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14 inventors (with patents filed for the assignee):
Robert H Meier (5 out of 6 patents)
Helena Peters (5 out of 5 patents)
Juan B Paez (4 out of 4 patents)
4. Evelyn Farr (3 out of 3 patents)
5. James H Tyo (2 out of 2 patents)
6. Gary W Gray (1 out of 13 patents)
7. Gordon B Bart (1 out of 5 patents)
8. Carol L Hiemstra-Paez (1 out of 1 patent)
9. Linda K Zander (1 out of 1 patent)
10. Henry W Rosenberg (1 out of 1 patent)
11. Jerry E Seel (1 out of 6 patents)
12. Carol L Hiemstra (1 out of 1 patent)
13. Willard E Lanier (1 out of 1 patent)
14. Dennis V Meloy (1 out of 1 patent)
20 patents:
Company Overview
Camp International, Inc. is a technology-driven company based in Jackson, MI, specializing in the development and manufacturing of advanced solutions for various industries. The organization focuses on innovative engineering and design, particularly in the fields of automotive and industrial applications. With a commitment to quality and performance, Camp International leverages cutting-edge technology to enhance product functionality and efficiency, serving a diverse clientele across North America and beyond.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Camp International, Inc.. Retrieved from https://idiyas.com/company/camp-international
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]