The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 1991

Filed:

Jan. 02, 1990
Applicant:
Inventors:

Robert H Meier, Ann Arbor, MI (US);

Jerry E Seel, Adrian, MI (US);

Gary W Gray, Adrian, MI (US);

Assignee:

Camp International, Inc., Jackson, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A63B / ; A63B / ; A63B / ;
U.S. Cl.
CPC ...
272 96 ; 272146 ; 272D / ;
Abstract

The invention pertains to a method and apparatus for biomechanically analyzing the physical characteristics of the lower extremety including hip, knee and ankle joints and the muscles and ligaments, and the functioning thereof. A frame includes a weight sensing platform and a foot support in the form of a disc is mounted above the platform for nutation about a vertical axis. The periphery of the disc engages the platform, and actuates platform switches whereby a patient standing upon the disc with one foot may angularly displace the disc in a nutating manner applying weight to the platform through the disc periphery, and recording apparatus in the form of computerized data and a visual display permits analysis of the application of weight to the platform. The disc may be selectively vertically adjustable relative to the platform to vary the analysis characteristics.


Find Patent Forward Citations

Meier, Robert. (1991). Computerized biomechanical analysis system (U.S. Patent No. 4986534). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4986534

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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