Nuenen, Netherlands

C.c.m. Beheer B.v.


USPTO Granted Patents = 11


Forward Citations = 62

Loading Chart...
Loading Chart...

14 inventors (with patents filed for the assignee):

goldMedal Marinus F Bekkers (3 out of 3 patents)

silverMedal Arend-Jan Johan Beltman (2 out of 4 patents)

bronzeMedal Franciscus J Thoolen (2 out of 3 patents)

4.  Jasper Anne Frido Marikus Simons (1 out of 4 patents)

5.  Albert Brals (1 out of 7 patents)

6.  Ronald Plak (1 out of 2 patents)

7.  Franciscus Henricus Alphonsus Gerardus Fey (1 out of 1 patent)

8.  Lodewijk J Offringa (1 out of 2 patents)

9.  Henrikus P Clerx (1 out of 2 patents)

10.  Rudolf J Van Der Hoorn (1 out of 10 patents)

11.  Eugenio J Smits (1 out of 1 patent)

12.  Marc M Giebels (1 out of 1 patent)

13.  Josephus J Van Nunen (1 out of 1 patent)

14.  Joseph J Janssen (1 out of 1 patent)

15.  Marnix Aldert Tas (2 patents)


11 patents:

Company Overview
C.c.m. Beheer B.v. is a company based in Nuenen, Netherlands, specializing in the development and management of innovative solutions across various sectors. The organization focuses on enhancing operational efficiencies and fostering technological advancements, particularly in fields such as engineering and manufacturing. With a commitment to quality and innovation, C.c.m. Beheer B.v. plays a significant role in driving progress within its industry, leveraging expertise to meet evolving market demands and contribute to sustainable practices.
Profile summary synthesized from public USPTO records and patent filings.

logo

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

11 Patents

#1 in Nuenen

#569 in Netherlands

#51,801 in the World

Nuenen, NL
Nuenen, Netherlands
Forward Citations = 62

14 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: C.c.m. Beheer B.v.. Retrieved from https://idiyas.com/company/c-c-m-beheer-b-v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…