The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Oct. 03, 2006
Franciscus Henricus Alphonsus Gerardus Fey, Eindhoven, NL;
Franciscus Henricus Alphonsus Gerardus Fey, Eindhoven, NL;
C.C.M. Beheer B.V., Nuenen, NL;
Abstract
The invention provides a fluorescence microscope and a method for using this to measure fluorescence. The microscope comprises a silicon wafer filter membrane which is highly-planar and does not fluoresce. Moreover, it has a very high perforation density, so that a small surface area is sufficient for effective measurement. Using a camera as the location-sensitive detector moreover makes it possible to take advantage of better optical resolution, which means that optics having a smaller numerical aperture and a smaller magnification factor can be employed, with a greater working distance. All these factors together provide a fluorescence microscope capable of much more rapid measurements than the existing fluorescence microscopes.