Forward Citations = 98

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5 inventors (with patents filed for the assignee):

Leonhard Taumann (4 out of 9 patents)

Volker Adolf Stieber (2 out of 2 patents)

Rudolf Schittenhelm (1 out of 11 patents)

4. Eberhard Stock (1 out of 1 patent)

5. Lothar Heinz (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 4157475 - Electron accelerator comprising a target exposed to the electron beam (1979-06-05),

2. 4140129 - Beam defining system in an electron accelerator (1979-02-20),

3. 4131799 - Ionization chamber (1978-12-26),

4. 4121109 - Electron accelerator with a target exposed to the electron beam (1978-10-17),

5. 4115830 - Monitoring system for high-voltage supply (1978-09-19),

6. 4109154 - X-ray beam compensation (1978-08-22),

Company Overview

Applied Radiation Corporation is a leading provider of radiation shielding solutions for the medical, nuclear, and industrial sectors. With over 30 years of experience, we offer a wide range of products and services such as lead shielding, lead bricks, and radiation barriers to help protect workers and the environment from harmful radiation exposure. Our team of experts is dedicated to providing innovative solutions that meet the highest safety standards.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

6 Patents

#24 in Walnut Creek, CA

#10,570 in California

#44,981 in US

Walnut Creek, CA, United States of America

Applied Radiation Corporation

Forward Citations = 98

5 inventors:

Leonhard Taumann (4 out of 9 patents)

Volker Adolf Stieber (2 out of 2 patents)

Rudolf Schittenhelm (1 out of 11 patents)

4. Eberhard Stock (1 out of 1 patent)

5. Lothar Heinz (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Applied Radiation Corporation. Retrieved from https://idiyas.com/company/applied-radiation

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]