The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 1978

Filed:

Apr. 01, 1977
Applicant:
Inventor:

Volker A Stieber, Lafayette, CA (US);

Assignee:

Applied Radiation Corporation, Walnut Creek, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250385 ;
Abstract

An ionization chamber for analyzing inhomogeneities in a radiated beam from a particle accelerator system has two measuring chambers formed by three mutually parallel walls spaced apart by spacer rings. Two of the three walls have single electrodes arranged thereon whereas a third wall has several mutually insulated electrodes applied on a measuring chamber side of the wall. The mutually insulated electrodes include a central circular electrode and a group of electrode segments arranged in circular fashion around the central electrode. Inhomogeneities in the radiation intensity of a beam being analyzed are detected by unequal currents in the central electrode relative to surrounding electrode segments or in the electrode segments themselves relative to each other.


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