Company Badge
USPTO Data Jan 1 1976 - Oct 27 2026
12 Patents
#53 in Redmond, WA
#583 in Washington
#25,589 in US
#48,235 in the World
Applied Microsystems Corporation
Forward Citations = 828
14 inventors:
Redmond, WA, United States of America
Applied Microsystems Corporation
Calculating rank
Trademarks = 1
Forward Citations = 828
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14 inventors (with patents filed for the assignee):
Stephen Caine O'Brien (3 out of 4 patents)
Marvin T Johnson (3 out of 3 patents)
Robin Knoke (2 out of 7 patents)
4. Peter D Krystad (2 out of 3 patents)
5. Andrew John Rees (2 out of 2 patents)
6. Jack H Profit (1 out of 9 patents)
7. Laurence C Brasfield (1 out of 3 patents)
8. Michael R Buckmaster (1 out of 2 patents)
9. Arnold S Berger (1 out of 2 patents)
10. Sidney Richards Maxwell, Iii (1 out of 3 patents)
11. Gary S Shankman (1 out of 1 patent)
12. Sidney R Maxwell (1 out of 1 patent)
13. William O Swan (1 out of 1 patent)
14. Eugene M Zumchak (1 out of 1 patent)
12 patents:
Company Overview
Applied Microsystems Corporation, based in Redmond, WA, specializes in advanced technology solutions for the semiconductor and electronics industries. The company focuses on developing innovative testing and measurement equipment that enhances the reliability and performance of electronic devices. With a commitment to research and development, Applied Microsystems plays a crucial role in advancing technologies that support various applications, including telecommunications and consumer electronics, ensuring high standards in product quality and efficiency.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Applied Microsystems Corporation. Retrieved from https://idiyas.com/company/applied-microsystems
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]