Advanced Measurement Technology, Inc.

Calculating rank

USPTO Granted Patents = 6

% Expired Patents = 50.0

EPO Patents = 1

Trademarks = 30

Forward Citations = 13

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13 inventors (with patents filed for the assignee):

John Christopher Harper (1 out of 1 patent)

Oliver James Curnick (1 out of 1 patent)

Jonathan Edward Harrisson Sansom (1 out of 1 patent)

4. Charles R Sides (1 out of 1 patent)

5. Frank Sergent (1 out of 1 patent)

6. Jesse Ursery (1 out of 3 patents)

7. Rex C Trammell (1 out of 6 patents)

8. Timothy R Twomey (1 out of 2 patents)

9. Russell D Bingham (1 out of 10 patents)

10. Dale A Gedcke (1 out of 9 patents)

11. Jeffrey V Peck (1 out of 4 patents)

12. Brian Sayers (1 out of 1 patent)

13. Christopher James Ward (1 out of 2 patents)

14. Jonathan Edward Harrison Samson (0 patent)

6 patents: Sort by Forward Citations

1. 11818210 - Systems and methods of direct data storage for measurement instrumentation (2023-11-14),

2. 11262412 - Battery monitoring and testing system and methods thereof (2022-03-01),

3. 11099209 - High range and resolution scanning probe and methods (2021-08-24),

4. 7312457 - Spectrometer with charge-carrier-trapping correction (2007-12-25),

5. 7279676 - Position sensitive radiation spectrometer (2007-10-09),

6. 6785194 - Method and apparatus for precision time interval measurement (2004-08-31),

Company Overview

Advanced Measurement Technology, Inc. is a leading provider of innovative measurement solutions for various industries. With a focus on precision and accuracy, we offer a range of cutting-edge tools and technologies to help businesses improve their efficiency and effectiveness. Our team of experienced professionals is dedicated to delivering top-quality products and exceptional customer service.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

6 Patents

#21 in Oak Ridge, TN

#478 in Tennessee

#45,063 in US

Oak Ridge, TN, United States of America

Advanced Measurement Technology, Inc.

Forward Citations = 13

13 inventors:

John Christopher Harper (1 out of 1 patent)

Oliver James Curnick (1 out of 1 patent)

Jonathan Edward Harrisson Sansom (1 out of 1 patent)

4. Charles R Sides (1 out of 1 patent)

5. Frank Sergent (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Advanced Measurement Technology, Inc.. Retrieved from https://idiyas.com/company/advanced-measurement-technology

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]