The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Oct. 07, 2019
Applicant:

Advanced Measurement Technology Inc., Oak Ridge, TN (US);

Inventors:

Christopher James Ward, Basingstoke, GB;

Brian Sayers, Knoxville, TN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 67/1097 (2022.01); G01N 27/02 (2006.01); G06F 13/28 (2006.01);
U.S. Cl.
CPC ...
H04L 67/1097 (2013.01); G01N 27/026 (2013.01); G06F 13/28 (2013.01);
Abstract

Systems and methods of writing data acquired from measurement instrumentation. Embodiments include establishing a direct data connection between the test equipment and a network storage drive, generating test data from a sample under test, and writing the test data to the network storage drive without assistance of a computerized controlling device configured to control the testing device.


Find Patent Forward Citations

Ward, Christopher. (2023). Systems and methods of direct data storage for measurement instrumentation (U.S. Patent No. 11818210). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11818210

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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