% Expired Patents = 16.7

Forward Citations = 88

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2 inventors (with patents filed for the assignee):

Peiching Ling (6 out of 33 patents)

Tien Tien (2 out of 3 patents)

6 patents: Sort by Forward Citations

1. 6323110 - Structure and fabrication process of silicon on insulator wafer (2001-11-27),

2. 6138606 - Ion implanters for implanting shallow regions with ion dopant compounds (2000-10-31),

3. 6109207 - Process for fabricating semiconductor device with shallow p-type regions (2000-08-29),

4. 5871653 - Methods of manufacturing micro-lens array substrates for implementation (1999-02-16),

5. 5863831 - Process for fabricating semiconductor device with shallow p-type regions (1999-01-26),

6. 5811852 - Memory cell structure fabricated with improved fabrication process by (1998-09-22),

Company Overview

Advanced Materials Engineering Research Inc. (AMER) is a leading research and development company specializing in cutting-edge materials engineering solutions. With a team of experienced scientists and engineers, AMER focuses on researching and developing new materials for various industries including aerospace, automotive, and electronics. The company is committed to providing innovative and cost-effective solutions to meet the demands of the rapidly evolving materials science landscape.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

6 Patents

#431 in Sunnyvale, CA

#10,578 in California

#45,007 in US

Sunnyvale, CA, United States of America

Advanced Materials Engineering Research Inc.

Forward Citations = 88

2 inventors:

Peiching Ling (6 out of 33 patents)

Tien Tien (2 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Advanced Materials Engineering Research Inc.. Retrieved from https://idiyas.com/company/advanced-materials-engineering-research

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]