The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2018

Filed:

Oct. 26, 2016
Applicant:

Freescale Semiconductor, Inc., Austin, TX (US);

Inventors:

Robert Wenzel, Austin, TX (US);

Tingdong Zhou, Austin, TX (US);

David Clegg, Austin, TX (US);

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05K 1/11 (2006.01); H05K 3/34 (2006.01); H05K 1/14 (2006.01); H05K 1/02 (2006.01); H05K 1/09 (2006.01);
U.S. Cl.
CPC ...
H05K 1/115 (2013.01); H05K 1/0224 (2013.01); H05K 1/09 (2013.01); H05K 1/111 (2013.01); H05K 1/144 (2013.01); H05K 3/3436 (2013.01); H05K 3/3452 (2013.01); H05K 2201/041 (2013.01); H05K 2201/10378 (2013.01); H05K 2201/10734 (2013.01); H05K 2203/041 (2013.01);
Abstract

Embodiments of an interconnect structure are provided, the interconnect structure including: a reference plane structure having a first major surface and a second major surface opposite the first major surface, the reference plane structure including a plurality of through holes from the first major surface to the second major surface; a plurality of conductive columns, each conductive column centered within a through hole; and a plurality of isolation structures, each isolation structure fills an annular region within the through hole between each conductive column and surrounding portion of the reference plane structure.


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