The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2018

Filed:

Mar. 23, 2017
Applicants:

United Microelectronics Corp., Hsin-Chu, TW;

Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian province, CN;

Inventors:

Pin-Hong Chen, Tainan, TW;

Tsun-Min Cheng, Changhua County, TW;

Chih-Chieh Tsai, Kaohsiung, TW;

Tzu-Chieh Chen, Pingtung County, TW;

Kai-Jiun Chang, Taoyuan, TW;

Chia-Chen Wu, Nantou County, TW;

Yi-An Huang, New Taipei, TW;

Yi-Wei Chen, Taichung, TW;

Assignees:

UNITED MICROELECTRONICS CORP., Hsin-Chu, TW;

Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian province, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/108 (2006.01); H01L 29/06 (2006.01); H01L 21/762 (2006.01); H01L 21/311 (2006.01); H01L 21/28 (2006.01); H01L 29/423 (2006.01); H01L 21/033 (2006.01);
U.S. Cl.
CPC ...
H01L 27/10823 (2013.01); H01L 21/0332 (2013.01); H01L 21/28008 (2013.01); H01L 21/31144 (2013.01); H01L 21/76224 (2013.01); H01L 27/10876 (2013.01); H01L 29/0649 (2013.01); H01L 29/4236 (2013.01);
Abstract

A method for fabricating semiconductor device includes the steps of: forming a shallow trench isolation (STI) in a substrate; removing part of the STI to form a first trench; forming a cap layer in the first trench; forming a mask layer on the cap layer and the substrate; and removing part of the mask layer, part of the cap layer, and part of the STI to form a second trench.


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