The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2018

Filed:

May. 29, 2015
Applicants:

Asml Holding N.v., Veldhoven, NL;

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Earl William Ebert, Wilton, CT (US);

Franciscus Godefridus Casper Bijnen, Veldhoven, NL;

Assignees:

ASML HOLDING N.V., Veldhoven, NL;

ASML NETHERLANDS B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/54 (2006.01); G03F 7/20 (2006.01); G03F 9/00 (2006.01); G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
G03F 7/7085 (2013.01); G01B 11/14 (2013.01); G03F 9/7088 (2013.01);
Abstract

A measurement apparatus including an optical system to provide illumination radiation into a spot on a periodic structure and to receive radiation redirected by the periodic structure, the optical system including a first stop to block zero order radiation from the periodic structure and allow non-zero order radiation to pass, and a second stop to block zero order radiation passing the first stop and to allow the non-zero order radiation to pass, and a radiation detector, downstream of the optical system, to receive the non-zero order radiation.


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