The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2018

Filed:

Mar. 08, 2017
Applicants:

United Microelectronics Corp., Hsin-Chu, TW;

Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian province, CN;

Inventors:

Feng-Yi Chang, Tainan, TW;

Shih-Fang Tzou, Tainan, TW;

Fu-Che Lee, Taichung, TW;

Ming-Feng Kuo, Tainan, TW;

Li-Chiang Chen, Tainan, TW;

Assignees:

UNITED MICROELECTRONICS CORP., Hsin-Chu, TW;

Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian province, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/28 (2006.01); H01L 21/3213 (2006.01);
U.S. Cl.
CPC ...
H01L 21/28088 (2013.01); H01L 21/32135 (2013.01);
Abstract

A method for fabricating semiconductor device includes the steps of: providing a substrate having a memory region defined thereon; forming a trench in the substrate; forming a barrier layer in the trench; forming a conductive layer on the barrier layer; performing a first etching process to remove part of the conductive layer; and performing a second etching process to remove part of the barrier layer. Preferably, the second etching process comprises a non-plasma etching process.


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