The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Feb. 02, 2017
Applicant:

Nuflare Technology, Inc., Yokohama-shi, JP;

Inventors:

Yasuo Kato, Yokohama, JP;

Hideo Inoue, Miura-gun, JP;

Hiroshi Matsumoto, Yokohama, JP;

Ryoh Kawana, Yokohama, JP;

Assignee:

NuFlare Technology, Inc., Yokohama-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/00 (2006.01); H01J 37/147 (2006.01); H01J 37/317 (2006.01); H01J 37/20 (2006.01); H01J 37/04 (2006.01); H01J 37/304 (2006.01);
U.S. Cl.
CPC ...
H01J 37/147 (2013.01); H01J 37/045 (2013.01); H01J 37/20 (2013.01); H01J 37/304 (2013.01); H01J 37/3177 (2013.01); H01J 2237/0435 (2013.01); H01J 2237/202 (2013.01); H01J 2237/31774 (2013.01);
Abstract

In one embodiment, a multi charged particle beam writing apparatus includes processing circuitry that is programmed to perform the function of a data region determination part determining a data region based on boundaries of pixels obtained by dividing a writing area of a substrate into mesh-shaped regions, an irradiation range of multiple charged particle beams, and boundaries of stripe segments obtained by dividing the writing area into segments having a predetermined width such that the segments are arranged in a predetermined direction, a deflection coordinate adjustment part adjusting deflection coordinates of the multiple charged particle beams such that the boundaries of the pixels are mapped to a boundary of the irradiation range, and a correction part calculating a corrected dose of each beam of the multiple charged particle beams by distributing, based on a positional relationship between the beam and pixels in the data region, a dose of the beam corresponding to a pixel in the data region calculated based on write data to one or more beams, and adding doses distributed to the beam, and a writing mechanism, including a charged particle beam source, a deflector, and a stage on which a target object is placed, and the writing mechanism deflecting the multiple charged particle beams based on the adjusted deflection coordinates and applying the beams each having the corrected dose to write a pattern.


Find Patent Forward Citations

Loading…