The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
Nov. 23, 2015
Applicant:
Stmicroelectronics, Inc., Coppell, TX (US);
Inventors:
Shayan Srinivasa Garani, San Diego, CA (US);
Sivagnanam Parthasarathy, Carlsbad, CA (US);
Assignee:
STMICROELECTRONICS, INC, Carrollton, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01); G11B 20/18 (2006.01); G06F 11/20 (2006.01); G11B 20/10 (2006.01);
U.S. Cl.
CPC ...
G11B 20/1833 (2013.01); G06F 11/2094 (2013.01); G06F 2201/805 (2013.01); G06F 2201/85 (2013.01); G11B 20/10037 (2013.01); G11B 20/10046 (2013.01); G11B 20/10064 (2013.01); G11B 20/10074 (2013.01); G11B 20/10222 (2013.01); G11B 20/10287 (2013.01); G11B 20/10296 (2013.01); G11B 20/10379 (2013.01); G11B 2020/185 (2013.01); G11B 2020/1823 (2013.01); G11B 2020/1826 (2013.01); G11B 2020/1863 (2013.01); G11B 2220/2516 (2013.01);
Abstract
An embodiment of a data-read path includes a defect detector and a data-recovery circuit. The defect detector is operable to identify a defective region of a data-storage medium, and the data-recovery circuit is operable to recover data from the data-storage medium in response to the defect detector. For example, such an embodiment may allow identifying a defective region of a data-storage disk caused, e.g., by a scratch or contamination, and may allow recovering data that was written to the defective region.