The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Jun. 29, 2015
Cadence Design Systems, Inc., San Jose, CA (US);
Vivek Chickermane, Slaterville Springs, NY (US);
Krishna Vijaya Chakravadhanula, Vestal, NY (US);
Brian Edward Foutz, Charlottesville, VA (US);
Steev Wilcox, San Jose, CA (US);
Paul Alexander Cunningham, Mountain View, CA (US);
David George Scott, Endwell, NY (US);
Louis Christopher Milano, Endwell, NY (US);
Dale Edward Meehl, Melbourne, FL (US);
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
Systems and methods efficiently bring additional variables into a Pseudo-Random Pattern Generator ('PRPG') in the early cycles of an automatic test pattern generation ('ATPG') process without utilizing any additional hardware or control pins. Overscanning (e.g., scanning longer than the length of the longest channel) for some additional cycles brings in enough variables into the PRPG. Data corresponding to earlier cycles of the ATPG process is removed.