The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Aug. 25, 2015
Applicant:

Disco Corporation, Tokyo, JP;

Inventors:

Ryosuke Nishihara, Tokyo, JP;

Minoru Matsuzawa, Tokyo, JP;

Kohei Tsujimoto, Tokyo, JP;

Tetsukazu Sugiya, Tokyo, JP;

Assignee:

Disco Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/304 (2006.01); B24B 1/00 (2006.01); B24B 37/10 (2012.01); B24B 7/22 (2006.01); B24B 37/04 (2012.01); B24B 37/30 (2012.01);
U.S. Cl.
CPC ...
H01L 21/304 (2013.01); B24B 1/00 (2013.01); B24B 7/228 (2013.01); B24B 37/042 (2013.01); B24B 37/10 (2013.01); B24B 37/30 (2013.01);
Abstract

A wafer processing method includes a first grinding step and a second grinding step. In the first grinding step, first grinding abrasives are moved in a processing feed direction that is a direction orthogonal to a holding surface of a chuck table of grinding apparatus and a wafer is ground to form a first circular recess in the back surface of the wafer. In the second grinding step, second grinding abrasives formed of finer abrasive grains than the first grinding abrasives are moved down in an oblique direction from the center side of the wafer toward the periphery of the wafer and the first circular recess is ground.


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