The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Mar. 19, 2014
Applicant:

Hitachi Kokusai Electric Inc., Tokyo, JP;

Inventors:

Tatsushi Ueda, Toyama, JP;

Junichi Tanabe, Toyama, JP;

Katsuhiko Yamamoto, Toyama, JP;

Yuki Taira, Toyama, JP;

Naofumi Ohashi, Toyama, JP;

Hideharu Itatani, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); C23C 16/455 (2006.01); C23C 16/458 (2006.01); C23C 16/52 (2006.01); C23C 16/40 (2006.01); C23C 16/44 (2006.01); C23C 16/509 (2006.01); H01L 21/687 (2006.01); H01J 37/32 (2006.01); C23C 16/56 (2006.01); G03F 7/20 (2006.01); G03F 7/32 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0228 (2013.01); C23C 16/401 (2013.01); C23C 16/4412 (2013.01); C23C 16/4584 (2013.01); C23C 16/45538 (2013.01); C23C 16/45542 (2013.01); C23C 16/45551 (2013.01); C23C 16/45557 (2013.01); C23C 16/45559 (2013.01); C23C 16/509 (2013.01); C23C 16/52 (2013.01); H01J 37/32091 (2013.01); H01J 37/32449 (2013.01); H01J 37/32541 (2013.01); H01J 37/32568 (2013.01); H01J 37/32752 (2013.01); H01J 37/32779 (2013.01); H01J 37/32834 (2013.01); H01L 21/02164 (2013.01); H01L 21/02219 (2013.01); H01L 21/02274 (2013.01); H01L 21/68764 (2013.01); H01L 21/68771 (2013.01); H01L 21/68785 (2013.01); C23C 16/56 (2013.01); G03F 7/20 (2013.01); G03F 7/32 (2013.01); H01J 37/32899 (2013.01); H01J 2237/327 (2013.01); H01J 2237/334 (2013.01); H01J 2237/3321 (2013.01); H01J 2237/3323 (2013.01);
Abstract

A semiconductor device manufacturing method, including: mounting substrates on a mounting table within a processing chamber along a rotation direction of the table; starting to supply a first-element-containing gas to a first region in the chamber along the rotation direction, while rotating the table and exhausting the processing chamber; starting to supply a second-element-containing gas to a second region in the chamber; starting to generate, by a plasma generating unit in the second region, plasma of the second-element-containing gas in the second region to have a first activity; and forming a thin film containing first and second elements on the substrates by rotating the table to cause the substrates to sequentially pass through the first and second regions in turn so that a first-element-containing layer is formed in the first region and is modified in the second region by generating plasma having a second activity higher than the first activity.


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