The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9754073 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 05, 2017

Filed:

Aug. 15, 2016
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Huang-Yu Chen, Hsin-Chu, TW;

Yuan-Te Hou, Hsin-Chu, TW;

Yu-Hsiang Kao, Hsin-Chu, TW;

Ken-Hsien Hsieh, Hsin-Chu, TW;

Ru-Gun Liu, Hsin-Chu, TW;

Lee-Chung Lu, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G03F 7/0035 (2013.01); G06F 17/5068 (2013.01); G06F 17/5072 (2013.01); G06F 2217/08 (2013.01); G06F 2217/12 (2013.01); Y02P 90/265 (2015.11);
Abstract

A method includes receiving a target pattern that is defined by a main pattern, a first cut pattern, and a second cut pattern, with a computing system, checking the target pattern for compliance with a first constraint, the first constraint associated with the first cut pattern, with the computing system, checking the target pattern for compliance with a second constraint, the second constraint associated with the second cut pattern, and with the computing system, modifying the pattern in response to determining that a violation of either the first constraint or the second constraint is found during the checking.


Find Patent Forward Citations

Chen, Huang-Yu. (2017). Layout optimization for integrated circuit design (U.S. Patent No. 9754073). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9754073

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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