The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2017

Filed:

Apr. 25, 2016
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Bencherki Mebarki, Santa Clara, CA (US);

Pramit Manna, Sunnyvale, CA (US);

Li Yan Miao, San Francisco, CA (US);

Deenesh Padhi, Sunnyvale, CA (US);

Bok Hoen Kim, San Jose, CA (US);

Christopher Dennis Bencher, Cupertino, CA (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/033 (2006.01); H01L 21/02 (2006.01); H01L 21/027 (2006.01); H01L 21/3105 (2006.01); H01L 21/311 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0337 (2013.01); H01L 21/0273 (2013.01); H01L 21/02118 (2013.01); H01L 21/02266 (2013.01); H01L 21/02274 (2013.01); H01L 21/31058 (2013.01); H01L 21/31138 (2013.01); H01L 2221/00 (2013.01);
Abstract

Embodiments of the disclosure relate to deposition of a conformal organic material over a feature formed in a photoresist or a hardmask, to decrease the critical dimensions and line edge roughness. In various embodiments, an ultra-conformal carbon-based material is deposited over features formed in a high-resolution photoresist. The conformal organic layer formed over the photoresist thus reduces both the critical dimensions and the line edge roughness of the features.


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