The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2017

Filed:

Oct. 12, 2016
Applicants:

International Business Machines Corporation, Armonk, NY (US);

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Hongyun Cottle, Schenectady, NY (US);

Cheng Chi, Jersey City, NJ (US);

Chi-Chun Liu, Altamont, NY (US);

Kristin Schmidt, Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01); C09K 13/00 (2006.01); H01L 21/302 (2006.01); C30B 29/58 (2006.01); H01L 21/311 (2006.01); C30B 19/12 (2006.01); C30B 33/08 (2006.01); B81C 1/00 (2006.01);
U.S. Cl.
CPC ...
G03F 7/0002 (2013.01); C09K 13/00 (2013.01); C30B 19/12 (2013.01); C30B 29/58 (2013.01); C30B 33/08 (2013.01); H01L 21/302 (2013.01); H01L 21/31138 (2013.01); B81C 1/00396 (2013.01); B81C 1/00531 (2013.01); B81C 2201/0149 (2013.01);
Abstract

Graphoepitaxy directed self-assembly methods generally include grafting a conformal layer of a polymer brush onto a topographic substrate. A planarization material, which functions as a sacrificial material is coated onto the topographic substrate. The planarization material is etched back to a top surface of the topographic substrate, wherein the etch back removes the polymer brush from the top surfaces of the topographic substrate. The remaining portion of the polymer brush is protected by the remaining planarization material below the top surface of the topographic substrate, which can be removed with a solvent to provide the topographic substrate with a conformal polymer brush below the top surface of the topographic substrate. The substrate is then coated with a block copolymer and annealed to direct self-assembly of the block copolymer. The methods mitigate island and/or hole defect formation.


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