The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2017

Filed:

Sep. 12, 2013
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:
Assignee:

ASML NETHERLANDS B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/68 (2006.01); G03F 7/20 (2006.01); G01D 5/244 (2006.01); G01D 18/00 (2006.01); G01D 5/347 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70775 (2013.01); G01D 5/2449 (2013.01); G01D 5/34707 (2013.01); G01D 18/00 (2013.01); G01D 18/008 (2013.01); G03F 7/70516 (2013.01);
Abstract

A method for calibrating an encoder scale having an array of marks in a first direction, includes moving the encoder scale in the first direction relative to a first encoder-type sensor, a second encoder-type sensor and a third encoder-type sensor, wherein the first encoder-type sensor and the second encoder-type sensor are fixedly spaced in the first direction at a first distance relative to each other, wherein the second encoder-type sensor and the third encoder-type sensor are fixedly spaced in the first direction at a second distance relative to each other.


Find Patent Forward Citations

Dekkers, Jeroen. (2017). Method for calibration of an encoder scale and a lithographic apparatus (U.S. Patent No. 9606458). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9606458

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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