The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2017

Filed:

Feb. 26, 2015
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Ganesh Balasubramanian, Sunnyvale, CA (US);

Juan Carlos Rocha-Alvarez, San Carlos, CA (US);

Ramprakash Sankarakrishnan, Santa Clara, CA (US);

Robert Kim, Mountain View, CA (US);

Dale R. Du Bois, Los Gatos, CA (US);

Kirby Hane Floyd, San Jose, CA (US);

Amit Kumar Bansal, Sunnyvale, CA (US);

Tuan Anh Nguyen, San Jose, CA (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/687 (2006.01); C23C 16/458 (2006.01); C23C 16/509 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
C23C 16/4584 (2013.01); C23C 16/4585 (2013.01); C23C 16/5096 (2013.01); H01J 37/32568 (2013.01); H01J 37/32623 (2013.01); H01J 37/32715 (2013.01); H01J 37/32743 (2013.01); H01L 21/68742 (2013.01); H01L 21/68792 (2013.01);
Abstract

A method and apparatus for processing a substrate are provided. The apparatus includes a pedestal and rotation member, both of which are moveably disposed within a processing chamber. The rotation member is adapted to rotate a substrate disposed in the chamber. The substrate may be supported by an edge ring during processing. The edge ring may selectively engage either the pedestal or the rotation member. In one embodiment, the edge ring engages the pedestal during a deposition process and the edge ring engages the rotation member during rotation of the substrate. The rotation of the substrate during processing may be discrete or continuous.


Find Patent Forward Citations

Loading…