The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2016

Filed:

Nov. 24, 2015
Applicant:

Alpha and Omega Semiconductor Incorporated, Sunnyvale, CA (US);

Inventors:

Yan Xun Xue, Los Gatos, CA (US);

Hamza Yilmaz, Gilroy, CA (US);

Yueh-Se Ho, Sunnyvale, CA (US);

Jun Lu, San Jose, CA (US);

Zhiqiang Niu, Santa Clara, CA (US);

Guo Feng Lian, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); H01L 21/461 (2006.01); H01L 21/56 (2006.01); H01L 21/78 (2006.01); H01L 21/768 (2006.01); H01L 23/492 (2006.01); H01L 23/31 (2006.01);
U.S. Cl.
CPC ...
H01L 24/94 (2013.01); H01L 21/461 (2013.01); H01L 21/561 (2013.01); H01L 21/76898 (2013.01); H01L 21/78 (2013.01); H01L 23/492 (2013.01); H01L 24/11 (2013.01); H01L 24/97 (2013.01); H01L 23/3114 (2013.01); H01L 24/05 (2013.01); H01L 24/06 (2013.01); H01L 24/13 (2013.01); H01L 24/32 (2013.01); H01L 24/73 (2013.01); H01L 24/83 (2013.01); H01L 2224/02371 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/04026 (2013.01); H01L 2224/05025 (2013.01); H01L 2224/0557 (2013.01); H01L 2224/05571 (2013.01); H01L 2224/06181 (2013.01); H01L 2224/11009 (2013.01); H01L 2224/131 (2013.01); H01L 2224/13013 (2013.01); H01L 2224/13014 (2013.01); H01L 2224/13022 (2013.01); H01L 2224/32245 (2013.01); H01L 2224/73104 (2013.01); H01L 2224/73153 (2013.01); H01L 2224/83005 (2013.01); H01L 2224/94 (2013.01); H01L 2224/97 (2013.01); H01L 2924/00014 (2013.01); H01L 2924/1306 (2013.01); H01L 2924/13091 (2013.01); H01L 2924/181 (2013.01);
Abstract

A wafer process for molded chip scale package (MCSP) comprises: depositing metal bumps on bonding pads of chips on a wafer; forming a first packaging layer at a front surface of the wafer to cover the metal bumps; forming an un-covered ring at an edge of the wafer to expose two ends of each scribe line of a plurality of scribe lines; thinning the first packaging layer to expose metal bumps; forming cutting grooves; grinding a back surface of the wafer to form a recessed space and a support ring at the edge of the wafer; depositing a metal seed layer at a bottom surface of the wafer in the recessed space; cutting off an edge portion of the wafer; flipping and mounting the wafer on a substrate; depositing a metal layer covering the metal seed layer; removing the substrate from the wafer; and separating individual chips from the wafer by cutting through the first packaging layer, the wafer, the metal seed layers and the metal layers along the scribe lines.


Find Patent Forward Citations

Loading…