The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 06, 2016

Filed:

Nov. 09, 2011
Applicants:

Jun'ichi Taguchi, Tokyo, JP;

Mitsuji Ikeda, Tokyo, JP;

Yuichi Abe, Tokyo, JP;

Masahiro Kitazawa, Tokyo, JP;

Inventors:

Jun'ichi Taguchi, Tokyo, JP;

Mitsuji Ikeda, Tokyo, JP;

Yuichi Abe, Tokyo, JP;

Masahiro Kitazawa, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06K 9/3275 (2013.01);
Abstract

An evaluation value indicative of the extent of lines in each direction is calculated for a pre-processed image in which 0s are filled in and extended in the lateral direction of the inputted image and which has been reduced ⅛th in the longitudinal direction. To obtain the angle of rotation of an image from the change in the evaluation value obtained while the angle relative to the lateral direction of the pre-processed image is modified in small steps, a parallel line is drawn for each direction, a projection is taken, and the sum of squares serves as the evaluation value of the direction. The direction having the highest evaluation value serves as the obtained direction of rotation from the normal position. The projection of each direction references the point of intersection between the parallel line drawn for each direction and the coordinate line of the horizontal axis.


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