The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2016

Filed:

Apr. 09, 2013
Applicant:

Taiwan Semiconductor Manufacturing Co. Ltd., Hsin-Chu, TW;

Inventors:

Chih-Yi Chang, New Taipei, TW;

Liang-Yueh Ou Yang, New Taipei, TW;

Chen-Yuan Kao, Zhudong Township, TW;

Hung-Wen Su, Jhubei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C25D 5/18 (2006.01); C25D 7/12 (2006.01); C25D 5/02 (2006.01); C25D 3/38 (2006.01); C25D 17/00 (2006.01); C25D 17/10 (2006.01); H01L 21/288 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
C25D 5/02 (2013.01); C25D 3/38 (2013.01); C25D 5/18 (2013.01); C25D 7/123 (2013.01); C25D 17/001 (2013.01); C25D 17/002 (2013.01); C25D 17/007 (2013.01); C25D 17/10 (2013.01); H01L 21/2885 (2013.01); H01L 21/76877 (2013.01);
Abstract

The present disclosure relates to an electro-chemical plating (ECP) process which utilizes a dummy electrode as a cathode to perform plating for sustained idle times to mitigate additive dissociation. The dummy electrode also allows for localized plating function to improve product gapfill, and decrease wafer non-uniformity. A wide range of electroplating recipes may be applied with this strategy, comprising current plating up to approximately 200 Amps, localized plating with a resolution of approximately 1 mm, and reverse plating to remove material from the dummy electrode accumulated during the dummy plating process and replenish ionic material within the electroplating solution.


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