The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Jun. 11, 2015
Cadence Design Systems, Inc., San Jose, CA (US);
Vivek Chickermane, Slaterville Springs, NY (US);
Krishna Vijaya Chakravadhanula, Vestal, NY (US);
Brian Edward Foutz, Charlottesville, VA (US);
Steev Wilcox, San Jose, CA (US);
Paul Alexander Cunningham, Mountain View, CA (US);
David George Scott, Endwell, NY (US);
Louis Christopher Milano, Endwell, NY (US);
Dale Edward Meehl, Melbourne, FL (US);
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
Systems and methods disclosed herein provide for utilizing extra variables in the decompression equation set of an ATPG process for test patterns requiring an excess number of care bits than can be supported efficiently by the current hardware. An elastic interface is utilized between a tester and a decompressor network (e.g., sequential and combinational decompressors) in order to expand the test pattern length and/or the number of input variables. The systems and methods also provide care bits in early scan cycles of the ATPG process for sequential decompressors starting from a fixed state.