The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 2016
Filed:
May. 28, 2014
Applicant:
Taiwan Semiconductor Manufacturing Company Limited, Hsinchu, TW;
Inventors:
Huang-Ting Hsiao, Taoyuan County, TW;
An-Tai Xu, Cupertino, CA (US);
Pei-Haw Tsao, Tai-chung, TW;
Cheng-Hung Tsai, Tainan, TW;
Tsui-Mei Chen, Hsinchu, TW;
Nai-Cheng Lu, Hsinchu County, TW;
Assignee:
Taiwan Semiconductor Manufacturing Company Limited, Hsinchu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01); H01L 21/304 (2006.01); G06K 19/077 (2006.01);
U.S. Cl.
CPC ...
G06K 7/10366 (2013.01); G06K 7/10316 (2013.01); G06K 7/10336 (2013.01); H01L 21/304 (2013.01); G06K 19/07749 (2013.01);
Abstract
According to an exemplary embodiment, a method of detecting edge cracks in a die under test is provided. The method includes the following operations: receiving a command signal; providing power from the command signal; providing a response signal based on the command signal; and self-destructing based on the command signal.