The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Nov. 19, 2013
Applicant:

Taiwan Semiconductor Manufacturing Company Limited, Hsinchu, TW;

Inventors:

I-Shuo Liu, Hsinchu, TW;

Hui-Chi Huang, Hsinchu County, TW;

Jung-Tsan Tsai, New Taipei, TW;

Chien-Ping Lee, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 37/013 (2012.01); B24B 49/04 (2006.01); H01L 21/66 (2006.01); B24B 37/005 (2012.01); B24B 37/04 (2012.01); B24B 37/20 (2012.01); B24B 49/12 (2006.01); H01L 21/321 (2006.01);
U.S. Cl.
CPC ...
H01L 22/26 (2013.01); B24B 37/005 (2013.01); B24B 37/044 (2013.01); B24B 37/205 (2013.01); B24B 49/12 (2013.01); H01L 21/3212 (2013.01); H01L 22/12 (2013.01);
Abstract

Systems and methods are provided for performing chemical-mechanical planarization on an article. An example system for performing chemical-mechanical planarization on an article includes a polishing head configured to perform a chemical-mechanical planarization (CMP) on an article, a polishing pad configured to support the article, a light source configured to emit an incident light, a polishing fluid including a plurality of emitter particles capable of emitting a fluorescent light in response to the incident light, a fluorescence light detector configured to detect the fluorescent light, and at least one processor configured to control the polishing head based on the detected fluorescent light.


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