The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 19, 2016

Filed:

Sep. 30, 2014
Applicant:

Novellus Systems, Inc., Fremont, CA (US);

Inventors:

Anand Chandrashekar, Fremont, CA (US);

Esther Jeng, Los Altos, CA (US);

Raashina Humayun, Los Altos, CA (US);

Michal Danek, Cupertino, CA (US);

Juwen Gao, San Jose, CA (US);

Deqi Wang, San Jose, CA (US);

Assignee:

Novellus Systems, Inc., Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01); H01L 21/768 (2006.01); H01L 21/285 (2006.01); H01L 27/105 (2006.01); H01L 27/108 (2006.01); C23C 16/04 (2006.01); H01L 21/321 (2006.01); H01L 21/3213 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76879 (2013.01); C23C 16/045 (2013.01); H01L 21/28556 (2013.01); H01L 21/28562 (2013.01); H01L 21/32133 (2013.01); H01L 21/76874 (2013.01); H01L 21/76877 (2013.01); H01L 21/76883 (2013.01); H01L 21/76898 (2013.01); H01L 27/1052 (2013.01); H01L 27/10891 (2013.01); H01L 21/321 (2013.01); H01L 21/32136 (2013.01);
Abstract

Described herein are methods of filling features with tungsten and related systems and apparatus. The methods include inside-out fill techniques as well as conformal deposition in features. Inside-out fill techniques can include selective deposition on etched tungsten layers in features. Conformal and non-conformal etch techniques can be used according to various implementations. The methods described herein can be used to fill vertical features, such as in tungsten vias, and horizontal features, such as vertical NAND (VNAND) word lines. Examples of applications include logic and memory contact fill, DRAM buried word line fill, vertically integrated memory gate/word line fill, and 3-D integration with through-silicon vias (TSVs).


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