The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 2015

Filed:

Dec. 27, 2012
Applicants:

Intermolecular, Inc., San Jose, CA (US);

Elpida Memory, Inc, Tokyo, JP;

Inventors:

Sandra G. Malhotra, Fort Collins, CO (US);

Hanhong Chen, Milpitas, CA (US);

Wim Deweerd, San Jose, CA (US);

Arthur Gevondyan, San Francisco, CA (US);

Hiroyuki Ode, Higashihiroshima, JP;

Assignees:

Intermolecular, Inc., San Jose, CA (US);

Elpida Memory, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); H01L 29/92 (2006.01); H01L 49/02 (2006.01); H01L 51/52 (2006.01); H01L 51/00 (2006.01);
U.S. Cl.
CPC ...
H01L 29/92 (2013.01); H01L 28/65 (2013.01); H01L 28/75 (2013.01); H01L 51/0021 (2013.01); H01L 51/5206 (2013.01);
Abstract

Provided are MIM DRAM capacitors and methods of forming thereof. A MIM DRAM capacitor may include an electrode layer formed from a high work function material (e.g., greater than about 5.0 eV). This layer may be used to reduce the leakage current through the capacitor. The capacitor may also include another electrode layer having a high conductivity base portion and a conductive metal oxide portion. The conductive metal oxide portion serves to promote the growth of the high k phase of the dielectric layer.


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