The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2015
Filed:
Apr. 27, 2013
Peking University, Beijing, CN;
Ru Huang, Beijing, CN;
Qianqian Huang, Beijing, CN;
Zhan Zhan, Beijing, CN;
Yingxin Qiu, Beijing, CN;
Yangyuan Wang, Beijing, CN;
Peking University, Beijing, CN;
Abstract
The present invention provides a tunneling field effect transistor and a method for fabricating the same which refer to a field effect transistor logic device and circuit in a CMOS ultra-large integrated circuit (ULSI). The inventive concept of the invention lies in that, in a case of an N-type transistor, a side portion of a doped source region adjacent to an edge of the control gate is further implanted with P+ impurities on a basis of the doped source region being initially doped N− impurities, so that the initial N− impurities in the implanted portion are completely compensated by the P+ impurities, and in a case of a P-type transistor, a side portion of the doped source region adjacent to an edge of the control gate is implanted with N+ impurities on a basis of the doped source region being initially doped P− impurities, so that the initial P− impurities in the implanted portion are completely compensated by the N+ impurities. In the transistor, the source region is implanted twice with different doping concentrations, such that a large current characteristic of the MOSFET can be effectively combined to increase an on-state current of the transistor, and also, the threshold adjustment for the MOSFET portion and the TFET portion of the transistor can be achieved in a self-adaptive way.