The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Nov. 04, 2013
Applicant:

Globalfoundries Inc., Grand Cayman, KY (US);

Inventors:

Bharat Krishnan, Mechanicville, NY (US);

Jody A. Fronheiser, Delmar, NY (US);

Jinping Liu, Hopewell Junction, NY (US);

Bongki Lee, Malta, NY (US);

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 29/06 (2006.01); H01L 29/16 (2006.01); H01L 29/78 (2006.01); H01L 29/165 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0243 (2013.01); H01L 21/0262 (2013.01); H01L 21/02433 (2013.01); H01L 21/02532 (2013.01); H01L 21/02587 (2013.01); H01L 21/02609 (2013.01); H01L 21/02639 (2013.01); H01L 29/0657 (2013.01); H01L 29/16 (2013.01); H01L 29/165 (2013.01); H01L 29/1608 (2013.01); H01L 29/785 (2013.01);
Abstract

A semiconductor structure includes a bulk silicon substrate and one or more silicon fins coupled to the bulk silicon substrate. Stress-inducing material(s), such as silicon, are epitaxially grown on the fins into naturally diamond-shaped structures using a controlled selective epitaxial growth. The diamond shaped structures are subjected to annealing at about 750° C. to about 850° C. to increase an area of (100) surface orientation by reshaping the shaped structures from the annealing. Additional epitaxy is grown on the increased (100) area. Multiple cycles of increasing the area of (100) surface orientation (e.g., by the annealing) and growing additional epitaxy on the increased area are performed to decrease the width of the shaped structures, increasing the space between them to prevent them from merging, while also increasing their volume.


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