The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

May. 29, 2014
Applicant:

Cabot Microelectronics Corporation, Aurora, IL (US);

Inventors:

Tina Li, Warrenville, IL (US);

Kevin Dockery, Aurora, IL (US);

Renhe Jia, Naperville, IL (US);

Jeffrey Dysard, St. Charles, IL (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C09K 13/00 (2006.01); G09G 1/02 (2006.01); H01L 21/3105 (2006.01); C09K 3/14 (2006.01);
U.S. Cl.
CPC ...
G09G 1/02 (2013.01); C09K 3/1463 (2013.01); H01L 21/31053 (2013.01);
Abstract

The invention provides a chemical-mechanical polishing composition containing a ceria abrasive and a polymer of formula I: wherein Xand X, Yand Y, Zand Z, R, R, R, and R, and m are as defined herein, and water, wherein the polishing composition has a pH of about 1 to about 4.5. The invention further provides a method of chemically-mechanically polishing a substrate with the inventive chemical-mechanical polishing composition. Typically, the substrate contains silicon oxide, silicon nitride, and/or polysilicon.


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