The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2015

Filed:

Apr. 03, 2013
Applicant:

Jsr Corporation, Tokyo, JP;

Inventors:

Hirokazu Sakakibara, Tokyo, JP;

Masafumi Hori, Tokyo, JP;

Koji Ito, Tokyo, JP;

Reiko Kimura, Tokyo, JP;

Taiichi Furukawa, Tokyo, JP;

Assignee:

JSR CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/004 (2006.01); G03F 7/20 (2006.01); C08F 20/28 (2006.01); G03F 7/039 (2006.01); G03F 7/11 (2006.01); G03F 7/32 (2006.01); C08F 220/28 (2006.01);
U.S. Cl.
CPC ...
G03F 7/20 (2013.01); C08F 20/28 (2013.01); G03F 7/004 (2013.01); G03F 7/0046 (2013.01); G03F 7/0397 (2013.01); G03F 7/11 (2013.01); G03F 7/2041 (2013.01); G03F 7/325 (2013.01); C08F 2220/283 (2013.01);
Abstract

A pattern-forming method includes coating a radiation-sensitive resin composition on a substrate to provide a resist film. The resist film is exposed. The exposed resist film is developed. A developer solution used in developing the exposed resist film includes no less than 80% by mass of an organic solvent. The radiation-sensitive resin composition includes a first polymer and a radiation-sensitive acid generator. The first polymer includes a first structural unit having an acid-labile group and an alicyclic group. The alicyclic group is capable of avoiding dissociation from a molecular chain by an action of an acid.


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