The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9157151 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 13, 2015

Filed:

May. 31, 2007
Applicants:

Annamalai Lakshmanan, Santa Clara, CA (US);

Ganesh Balasubramanian, Sunnyvale, CA (US);

Francimar Schmitt, Santa Clara, CA (US);

Bok Hoen Kim, San Jose, CA (US);

Inventors:

Annamalai Lakshmanan, Santa Clara, CA (US);

Ganesh Balasubramanian, Sunnyvale, CA (US);

Francimar Schmitt, Santa Clara, CA (US);

Bok Hoen Kim, San Jose, CA (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05H 1/02 (2006.01); H05H 1/24 (2006.01); C23C 16/44 (2006.01); C23C 16/40 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
C23C 16/4405 (2013.01); C23C 16/401 (2013.01); H01J 37/32357 (2013.01); H01J 37/32862 (2013.01);
Abstract

The present invention generally provides an apparatus and method for eliminating the 'first wafer effect' for plasma enhanced chemical vapor deposition (PECVD). One embodiment of the present invention provides a method for preparing a chamber after the chamber being idle for a period of time. The method comprises a cleaning step followed by a season step and a heating step adapted to the length of the idle time.


Find Patent Forward Citations

Lakshmanan, Annamalai. (2015). Elimination of first wafer effect for pecvd films (U.S. Patent No. 9157151). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9157151

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