The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2015

Filed:

Sep. 28, 2012
Applicants:

Evan M. Fledell, Beaverton, OR (US);

Joe F. Walczyk, Tigard, OR (US);

Dinia P. Kitendaugh, Beaverton, OR (US);

Inventors:

Evan M. Fledell, Beaverton, OR (US);

Joe F. Walczyk, Tigard, OR (US);

Dinia P. Kitendaugh, Beaverton, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); H02J 15/00 (2006.01); H01R 13/24 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06722 (2013.01); H01R 13/2421 (2013.01); H02J 15/00 (2013.01); Y10T 29/49117 (2015.01); Y10T 29/49169 (2015.01);
Abstract

A mechanism is described for facilitating a dynamic electro-mechanical interconnect capable of being employed in a test system according to one embodiment. A method of embodiments of the invention may include separating, via a cavity, a first conductor of an interconnect from a second conductor of the interconnect, and isolating, via the cavity serving as a buffer, a first electrical path provided through the first conductor from a second electrical path provided through the second conductor.


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