The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2015

Filed:

Jun. 12, 2012
Applicants:

Shuichiro Uda, Miyagi, JP;

Takaaki Nezu, Miyagi, JP;

Shinji Fuchigami, Miyagi, JP;

Koji Maruyama, Miyagi, JP;

Inventors:

Shuichiro Uda, Miyagi, JP;

Takaaki Nezu, Miyagi, JP;

Shinji Fuchigami, Miyagi, JP;

Koji Maruyama, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/3065 (2006.01); H01L 21/67 (2006.01); H01L 21/3213 (2006.01); H01J 37/32 (2006.01); H01L 21/768 (2006.01); H01L 21/308 (2006.01);
U.S. Cl.
CPC ...
H01L 21/3065 (2013.01); H01L 21/67069 (2013.01); H01L 21/30655 (2013.01); H01L 21/32132 (2013.01); H01L 21/32137 (2013.01); H01J 37/32449 (2013.01); H01J 37/32669 (2013.01); H01L 21/76898 (2013.01); H01L 21/308 (2013.01); H01L 21/3081 (2013.01); H01J 37/32165 (2013.01); H01J 37/3266 (2013.01); H01J 2237/334 (2013.01);
Abstract

A plasma etching method includes supplying an etching gas containing an oxygen gas and a sulfur fluoride gas at a predetermined flow rate into a processing chamber that accommodates a processing substrate including a silicon layer and a resist layer, and etching the silicon layer with plasma generated from the etching gas using the resist layer as a mask. The plasma etching method further includes a first step of etching the silicon layer while a flow ratio of the oxygen gas to the sulfur fluoride gas is adjusted to a first flow ratio; a second step of etching the silicon layer while decreasing a flow rate of the oxygen gas to decrease the flow ratio to a second flow ratio, which is lower than the first flow ratio; and a third step of etching the silicon layer while the flow ratio is adjusted to the second flow ratio.


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