The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2015

Filed:

Mar. 03, 2009
Applicants:

Minoru Ueshima, Matsudo, JP;

Masayuki Suzuki, Soka, JP;

Yoshie Yamanaka, Tokyo, JP;

Shunsaku Yoshikawa, Soka, JP;

Tokuro Yamaki, Kobe, JP;

Tsukasa Ohnishi, Koshigaya, JP;

Inventors:

Minoru Ueshima, Matsudo, JP;

Masayuki Suzuki, Soka, JP;

Yoshie Yamanaka, Tokyo, JP;

Shunsaku Yoshikawa, Soka, JP;

Tokuro Yamaki, Kobe, JP;

Tsukasa Ohnishi, Koshigaya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 23/52 (2006.01); H01L 29/40 (2006.01); H01L 23/00 (2006.01); B23K 35/26 (2006.01); C22C 13/00 (2006.01); H01L 23/36 (2006.01); H01L 21/56 (2006.01); H01L 23/31 (2006.01); H01L 23/498 (2006.01);
U.S. Cl.
CPC ...
H01L 24/11 (2013.01); B23K 35/262 (2013.01); B23K 35/268 (2013.01); C22C 13/00 (2013.01); H01L 21/563 (2013.01); H01L 23/3114 (2013.01); H01L 23/3128 (2013.01); H01L 23/36 (2013.01); H01L 23/49816 (2013.01); H01L 24/13 (2013.01); H01L 24/16 (2013.01); H01L 24/32 (2013.01); H01L 24/81 (2013.01); H01L 2224/11849 (2013.01); H01L 2224/13111 (2013.01); H01L 2224/16 (2013.01); H01L 2224/73253 (2013.01); H01L 2224/81203 (2013.01); H01L 2224/81211 (2013.01); H01L 2224/81801 (2013.01); H01L 2924/01013 (2013.01); H01L 2924/01015 (2013.01); H01L 2924/01029 (2013.01); H01L 2924/0103 (2013.01); H01L 2924/01032 (2013.01); H01L 2924/01033 (2013.01); H01L 2924/01047 (2013.01); H01L 2924/01051 (2013.01); H01L 2924/01078 (2013.01); H01L 2924/01079 (2013.01); H01L 2924/01082 (2013.01); H01L 2924/01322 (2013.01); H01L 2924/01327 (2013.01); H01L 2924/09701 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/15787 (2013.01); H01L 2924/15788 (2013.01); H01L 2924/16195 (2013.01); H01L 2924/3511 (2013.01); H01L 2224/0558 (2013.01); H01L 2224/05644 (2013.01); H01L 2924/00013 (2013.01); H01L 2924/01006 (2013.01); H01L 2924/01023 (2013.01); H01L 2924/0105 (2013.01); H01L 2924/01087 (2013.01); H01L 2924/014 (2013.01); H01L 2224/8191 (2013.01); H01L 2924/10253 (2013.01); H01L 2224/11334 (2013.01);
Abstract

Solder used for flip chip bonding inside a semiconductor package was a Sn—Pb solder such as a Pb-5Sn composition. Lead-free solders which have been studied are hard and easily form intermetallic compounds with Sn, so they were not suitable for a flip chip connection structure inside a semiconductor package, which requires stress relaxation properties. This problem is eliminated by a flip chip connection structure inside a semiconductor package using a lead-free solder which is characterized by consisting essentially of 0.01-0.5 mass percent of Ni and a remainder of Sn. 0.3-0.9 mass percent of Cu and 0.001-0.01 mass percent of P may be added to this solder composition.


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