The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2015

Filed:

Feb. 13, 2009
Applicants:

Peter Paul Hempenius, Nuenen, NL;

Dirk-jan Bijvoet, Eindhoven, NL;

Youssef Karel Maria DE Vos, Lille, BE;

Ramidin Izair Kamidi, Eindhoven, NL;

Inventors:

Peter Paul Hempenius, Nuenen, NL;

Dirk-Jan Bijvoet, Eindhoven, NL;

Youssef Karel Maria De Vos, Lille, BE;

Ramidin Izair Kamidi, Eindhoven, NL;

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 27/58 (2006.01); G03B 27/68 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G03F 7/7095 (2013.01); G03F 7/70783 (2013.01); G03F 7/707 (2013.01);
Abstract

A lithographic apparatus includes an illumination system configured to condition a radiation beam, a support constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam, a substrate table constructed to hold a substrate, a projection system configured to project the patterned radiation beam onto a target portion of the substrate, a chuck configured to hold and position an object, for example, the patterning device onto the support or the substrate onto the substrate table, the chuck including a base and a constraining layer. A damping layer including a viscoelastic material is provided between the base and the constraining layer.


Find Patent Forward Citations

Loading…