The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2014

Filed:

Sep. 18, 2011
Applicants:

Lionel Chien Hui Tay, Singapore, SG;

Henry D. Bathan, Singapore, SG;

Zigmund R. Camacho, Singapore, SG;

Inventors:

Lionel Chien Hui Tay, Singapore, SG;

Henry D. Bathan, Singapore, SG;

Zigmund R. Camacho, Singapore, SG;

Assignee:

STATS ChipPAC, Ltd., Singapore, SG;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 25/10 (2006.01); H01L 25/065 (2006.01); H01L 23/538 (2006.01); H01L 21/683 (2006.01); H01L 23/00 (2006.01); H01L 23/31 (2006.01); H01L 23/495 (2006.01);
U.S. Cl.
CPC ...
H01L 23/5389 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/19107 (2013.01); H01L 2924/01074 (2013.01); H01L 2224/2919 (2013.01); H01L 24/16 (2013.01); H01L 2924/01033 (2013.01); H01L 23/3128 (2013.01); H01L 2224/18 (2013.01); H01L 24/82 (2013.01); H01L 2224/73204 (2013.01); H01L 2225/1058 (2013.01); H01L 2924/01047 (2013.01); H01L 2225/06524 (2013.01); H01L 2924/01006 (2013.01); H01L 2224/81801 (2013.01); H01L 2924/30105 (2013.01); H01L 2924/014 (2013.01); H01L 25/105 (2013.01); H01L 25/0657 (2013.01); H01L 2924/01029 (2013.01); H01L 23/4951 (2013.01); H01L 24/96 (2013.01); H01L 24/81 (2013.01); H01L 24/18 (2013.01); H01L 2924/01073 (2013.01); H01L 2924/01013 (2013.01); H01L 2924/01024 (2013.01); H01L 2224/16225 (2013.01); H01L 2924/01079 (2013.01); H01L 2924/15331 (2013.01); H01L 2924/0104 (2013.01); H01L 21/6835 (2013.01); H01L 2224/32225 (2013.01); H01L 2924/0105 (2013.01); H01L 2924/04941 (2013.01); H01L 2924/01023 (2013.01); H01L 2924/01078 (2013.01); H01L 23/49575 (2013.01); H01L 2225/1035 (2013.01); H01L 2924/01082 (2013.01);
Abstract

A semiconductor device includes a first semiconductor die. A plurality of conductive vias is formed around the first semiconductor die. A first conductive layer is formed over a first surface of the first semiconductor die and electrically connects to the plurality of conductive vias. A second conductive layer is formed over a second surface of the first semiconductor die opposite the first surface and electrically connects to the plurality of conductive vias. A first passivation layer is formed over the first surface and includes openings that expose the first conductive layer. A second passivation layer is formed over the second surface and includes openings that expose the second conductive layer. Bonding pads are formed within the openings in the first and second passivation layers and are electrically connected to the first and second conductive layers. An interconnect structure is disposed within the openings in the first and second passivation layers.


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